Thermally activated mechanisms in crystal plasticity: volume 8
Éditeur :
Elsevier Science & Technology
ISBN :
9780080427034
Date de publication :
8 sept. 2003
Poids :
1170 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Contains data from a range of techniques, including synchrotron radiation X-ray topography that provide safer and surer methods of identifying deformation mechanisms. This book also informs the direction of research in intermediate and high temperature processes by providing original treatment of dislocation climb.