Fundamental principles of engineering nanometrology
Auteur :
Leach, Richard
Éditeur :
Leach, Richard
ISBN :
9780080964546
Date de publication :
9 nov. 2009
Dimensions :
25,4 x 17,8 x 2,3 cm
Poids :
862 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Presents the principles of engineering metrology applied to the micro- and nanoscale suitable for scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. This work also covers basic metrological terminology, and the important topic of measurement uncertainty.