Scanning transmission electron microscopy: advanced characterization methods for materials science applications
Éditeur :
Taylor & Francis Ltd
ISBN :
9780367655389
Date de publication :
7 oct. 2024
Dimensions :
23,4 x 15,6 cm
Poids :
300 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.