Digital noise monitoring of defect origin
Auteur :
Aliev, Telman
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9780387717531
Date de publication :
25 juil. 2007
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.