Nanometer technology designs: high-quality delay tests
Auteur :
Ahmed, Nisar
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9780387764863
Date de publication :
20 déc. 2007
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.