Microstructural characterization of materials
Auteur :
Brandon, David / Kaplan, Wayne D.
Éditeur :
John Wiley & Sons Inc
ISBN :
9780470027851
Date de publication :
14 mars 2008
Dimensions :
24,4 x 16,8 x 3,1 cm
Poids :
907 g
Langue :
Anglais
Pays d'origine :
USA
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle.