Two-dimensional x-ray diffraction
Auteur :
He, B. B.
Éditeur :
John Wiley and Sons Ltd
ISBN :
9780470227220
Date de publication :
4 sept. 2009
Dimensions :
24,0 x 16,8 x 2,9 cm
Poids :
776 g
Langue :
Anglais
Pays d'origine :
USA
Covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, and microstructure analysis.