Esd: failure mechanisms and models
Auteur :
Voldman, Steven H.
Éditeur :
John Wiley & Sons Inc
ISBN :
9780470511374
Date de publication :
17 juil. 2009
Dimensions :
25,2 x 17,8 x 2,8 cm
Poids :
812 g
Langue :
Anglais
Pays d'origine :
USA
Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.