Integrated circuit failure analysis: a guide to preparation techniques
Auteur :
Beck, Friedrich
Éditeur :
John Wiley & Sons Inc
ISBN :
9780471974017
Date de publication :
19 janv. 1998
Dimensions :
23,5 x 15,5 x 1,5 cm
Poids :
425 g
Langue :
Anglais
Pays d'origine :
USA
The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right.