Reflection high-energy electron diffraction
Auteur :
Ichimiya, Ayahiko / Cohen, Philip I.
Éditeur :
Cambridge University Press
ISBN :
9780521184021
Date de publication :
17 févr. 2011
Dimensions :
24,4 x 17,0 x 1,9 cm
Poids :
600 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.