Reflection electron microscopy and spectroscopy for surface analysis
Auteur :
Wang, Zhong Lin
Éditeur :
Cambridge University Press
ISBN :
9780521482660
Date de publication :
23 mai 1996
Dimensions :
24,4 x 17,0 x 2,5 cm
Poids :
930 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.