Characterisation of radiation damage by transmission electron microscopy
Auteur :
Jenkins, M.L / Kirk, M.A
Éditeur :
Taylor & Francis Ltd
ISBN :
9780750307482
Date de publication :
21 nov. 2000
Dimensions :
23,4 x 15,6 cm
Poids :
476 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.