Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits
Auteur :
Bushnell, M. / Agrawal, Vishwani
Éditeur :
Kluwer Academic Publishers
ISBN :
9780792379911
Date de publication :
30 nov. 2000
Dimensions :
25,4 x 17,8 cm
Langue :
Anglais
Pays d'origine :
USA
The modern electronic testing has a forty year history. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook.