Research perspectives and case studies in systems test and diagnosis

Auteur : Sheppard, John W.
ISBN : 9780792382638
Date de publication : 1 sept. 1998
Dimensions : 23,4 x 15,6 x 1,5 cm
Poids : 1170 g
Format : Laminated cover
Langue : Anglais
Pays d'origine : USA

System level testing is driven by the incessant march of complexity. System approaches embody the partitioning of problems into smaller inter-related subsystems that can be solved together. This title includes the works that are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998.

248,99 €
Prix de vente belge indicatif
Disponibilité
Print on Demand

Pour commander, veuillez vous connecter à votre compte.