Analog layout generation performance and manufacturability
Auteur :
Lampaert, Koen
Éditeur :
Lampaert, KoenGielen, Georges,Sansen, Willy M. C.,
ISBN :
9780792384793
Date de publication :
1 avr. 1999
Dimensions :
23,5 x 15,5 x 1,2 cm
Poids :
1000 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
Outlines a criterion to quantify the detectability of a fault and combines this with a yield model to evaluate the testability of an integrated circuit layout. This book is intended for analog engineers, researchers and students.