Modeling of electrical overstress in integrated circuits
Auteur :
Diaz, Carlos H.
Éditeur :
Diaz, Carlos H.Kang, Sung-Mo,
ISBN :
9780792395058
Date de publication :
3 nov. 1994
Dimensions :
23,4 x 15,6 x 1,1 cm
Poids :
432 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in integrated circuits. This book is intended for VLSI designers, reliability engineers and those working on the development of EOS/ESD analysis tools.