Testability concepts for digital ics: the macro test approach
Auteur :
Beenker, Frans P. M.
Éditeur :
Beenker, Frans P. M.Bennetts, Roger G.,Thijssen, A. P.,
ISBN :
9780792396581
Date de publication :
1 nov. 1995
Dimensions :
24,4 x 17,0 x 1,4 cm
Poids :
498 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.