Multi-chip module test strategies
Auteur :
Zorian, Yervant
ISBN :
9780792399209
Date de publication :
31 mai 1997
Dimensions :
25,4 x 20,3 x 1,1 cm
Poids :
576 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.