Recent developments in optical gauge block metrology
Auteur :
Decker, Jennifer E.
ISBN :
9780819429322
Date de publication :
31 mai 1999
Dimensions :
23,0 cm
Langue :
Anglais
Pays d'origine :
USA
This text brings together 34 papers presented at SPIE's 1998 annual meeting. They cover lasers, refractometry and instruments.