Microelectronic manufacturing yield, reliability, and failure analysis iv
Auteur :
Prasad, Sharad
ISBN :
9780819429698
Date de publication :
30 sept. 1998
Dimensions :
27,3 x 21,4 x 1,4 cm
Poids :
576 g
Langue :
Anglais
Pays d'origine :
USA
A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.