Digital shearography
Auteur :
Steinchen, Wolfgang
Éditeur :
SPIE Press
ISBN :
9780819441102
Date de publication :
31 janv. 2003
Dimensions :
26,6 x 18,3 x 2,4 cm
Poids :
875 g
Langue :
Anglais
Pays d'origine :
USA
Developed in the 1990s, shearography - also called speckle pattern shearing interferometry - is an optical measuring and testing method. This work describes the development of second-generation digital shearography, which is effective in nondestructive testing.