Stray light analysis and control
Auteur :
Fest, Eric
Éditeur :
SPIE Press
ISBN :
9780819493255
Date de publication :
30 avr. 2013
Poids :
415 g
Langue :
Anglais
Pays d'origine :
USA
Addresses stray light terminology, radiometry, and the physics of stray light mechanisms, such as surface roughness scatter and ghost reflections. The most-efficient ways of using stray light analysis software packages are included. The book also demonstrates how the basic principles are applied in the design, fabrication, and testing phases of optical system development.