Random testing of digital circuits: theory and applications
Auteur :
David
Éditeur :
Taylor & Francis Inc
ISBN :
9780824701826
Date de publication :
8 avr. 1998
Dimensions :
22,9 x 15,2 cm
Poids :
861 g
Langue :
Anglais
Pays d'origine :
USA
Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "