Speckle metrology
Auteur :
Sirohi
Éditeur :
Taylor & Francis Inc
ISBN :
9780824789329
Date de publication :
20 mai 1993
Dimensions :
22,9 x 15,2 cm
Poids :
861 g
Langue :
Anglais
Pays d'origine :
USA
Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).