Integrated circuit quality and reliability
Auteur :
Hnatek, Eugene R.
Éditeur :
Taylor & Francis Inc
ISBN :
9780824792831
Date de publication :
1 déc. 1994
Dimensions :
22,9 x 15,2 cm
Poids :
1650 g
Langue :
Anglais
Pays d'origine :
USA
Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.