Influence of temperature on microelectronics and system reliability: a physics of failure approach
Auteur :
Lall, Pradeep / Pecht, Michael / Hakim, Edward B.
Éditeur :
Taylor & Francis Inc
ISBN :
9780849394508
Date de publication :
24 avr. 1997
Dimensions :
25,4 x 17,8 cm
Poids :
975 g
Langue :
Anglais
Pays d'origine :
USA
This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.