Guidebook for managing silicon chip reliability
Auteur :
Pecht, Michael / Radojcic, Riko / Rao, Gopal
Éditeur :
Taylor & Francis Inc
ISBN :
9780849396243
Date de publication :
29 déc. 1998
Dimensions :
23,4 x 15,6 cm
Poids :
489 g
Langue :
Anglais
Pays d'origine :
USA
Examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This book provides a framework for how to model the mechanism, test for defects, and avoid and manage damage.