High resolution x-ray diffractometry and topography
Auteur :
Bowen, D.K. / Tanner, Brian K.
Éditeur :
Taylor & Francis Ltd
ISBN :
9780850667585
Date de publication :
5 févr. 1998
Dimensions :
24,6 x 17,4 cm
Poids :
650 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.