Yield and reliability in microwave circuit and system design
Auteur :
Meehan, Michael D.
Éditeur :
Meehan, Michael D.Purviance, John,
ISBN :
9780890065273
Date de publication :
1 déc. 1993
Dimensions :
22,9 x 15,2 x 2,0 cm
Poids :
611 g
Format :
Laminated cover
Langue :
Anglais
Pays d'origine :
USA
A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.