Mos interface physics, process and characterization
Auteur :
Wang, Shengkai / Wang, Xiaolei
Éditeur :
Taylor & Francis Ltd
ISBN :
9781032106281
Date de publication :
29 janv. 2024
Dimensions :
22,9 x 15,2 cm
Poids :
453 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.