Properties of crystalline materials by x-ray diffraction methods and symmetry groups: a practical approach
Auteur :
Zapata Mesa, John Fernando
Éditeur :
Taylor & Francis Ltd
ISBN :
9781032382371
Date de publication :
1 oct. 2025
Dimensions :
23,4 x 15,6 cm
Poids :
453 g
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book provides a structure and properties of crystalline materials from a rigorous and systematic approach. From physical principles of X-rays to structural refinement using the Rietveld method, it provides a solid theoretical and practical foundation. This book is a reference for materials characterization.