Semiconductor laser engineering, reliability and diagnostics: a practical approach to high power and single mode devices
Auteur :
Epperlein, Peter W.
Éditeur :
John Wiley & Sons Inc
ISBN :
9781119990338
Date de publication :
22 févr. 2013
Dimensions :
23,6 x 16,0 x 3,8 cm
Poids :
771 g
Langue :
Anglais
Pays d'origine :
USA
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.