Functional design errors in digital circuits: diagnosis correction and repair
Auteur :
Chang, Kai-hui / Markov, Igor L. / Bertacco, Valeria
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781402093647
Date de publication :
10 déc. 2008
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;