Defects in microelectronic materials and devices
Éditeur :
Taylor & Francis Inc
ISBN :
9781420043761
Date de publication :
19 nov. 2008
Dimensions :
25,4 x 17,8 cm
Poids :
1496 g
Langue :
Anglais
Pays d'origine :
USA
Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.