Measurement and modeling of silicon heterostructure devices
Auteur :
Cressler, John D.
Éditeur :
Taylor & Francis Inc
ISBN :
9781420066920
Date de publication :
13 déc. 2007
Dimensions :
25,4 x 17,8 cm
Poids :
530 g
Langue :
Anglais
Pays d'origine :
USA
Focuses on measurement and modeling of high-speed conductor devices. This book provides experience-based tricks of the trade and the subtle nuances of measuring and modeling. It covers topics including compact modeling using integrated CAD tools and design kits, noise mitigation approaches, Germanium RF designs, and, transmission lines.