Ion beam analysis: fundamentals and applications
Auteur :
Nastasi, Michael / Mayer, James W. / Wang, Yongqiang
Éditeur :
Taylor & Francis Inc
ISBN :
9781439846384
Date de publication :
27 août 2014
Dimensions :
23,4 x 15,6 cm
Poids :
362 g
Langue :
Anglais
Pays d'origine :
USA
This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R