Power-constrained testing of vlsi circuits: a guide to the ieee 1149.4 test standard
Auteur :
Nicolici, Nicola
Éditeur :
Nicolici, NicolaAl-Hashimi, Bashir M.,
ISBN :
9781441953155
Date de publication :
9 déc. 2010
Dimensions :
23,5 x 15,5 x 1,0 cm
Poids :
302 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
USA
The authors focus on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This book surveys existing methods & presents several test automation techniques for reducing power in scan-based sequential circuits.