Test and design-for-testability in mixed-signal integrated circuits
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781441954220
Date de publication :
7 déc. 2010
Dimensions :
24,4 x 17,0 cm
Langue :
Anglais
Pays d'origine :
USA
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.