Soft errors in modern electronic systems
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781441969927
Date de publication :
30 sept. 2010
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.