Variation-aware design of custom integrated circuits: a hands-on field guide
Auteur :
McConaghy, Trent / Breen, Kristopher / Dyck, Jeffrey / Gupta, Amit
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781461422686
Date de publication :
28 sept. 2012
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.