Extreme statistics in nanoscale memory design
Auteur :
Singhee, Amith
ISBN :
9781461426721
Date de publication :
5 nov. 2012
Dimensions :
23,5 x 15,5 x 1,3 cm
Poids :
367 g
Format :
Trade paperback (US)
Langue :
Anglais
Pays d'origine :
USA
This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community.