Electron energy-loss spectroscopy in the electron microscope
Auteur :
Egerton, R.F.
Éditeur :
Springer-Verlag New York Inc.
ISBN :
9781489986498
Date de publication :
1 oct. 2014
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
USA
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.