Computed tomography: principles, design, artifacts, and recent advances
Auteur :
Hsieh, Jiang
Éditeur :
SPIE Press
ISBN :
9781510646872
Date de publication :
30 oct. 2022
Poids :
800 g
Langue :
Anglais
Pays d'origine :
USA
Presents the most recent advances in technology and clinical applications. New to this edition are descriptions of artificial intelligence, machine learning, and deep learning, and their application to image reconstruction, protocol optimization, and workflow. A new chapter covers the principles and advances in dual-energy and spectral CT.