Defect and impurity engineered semiconductors and devices: volume 378
Éditeur :
Materials Research Society
ISBN :
9781558992818
Date de publication :
16 oct. 1995
Dimensions :
23,7 x 16,0 x 6,2 cm
Poids :
1700 g
Langue :
Anglais
Pays d'origine :
USA
Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities.