Soft error reliability of vlsi circuits: analysis and mitigation techniques
Auteur :
Ghavami, Behnam / Raji, Mohsen
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030516123
Date de publication :
14 oct. 2021
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.