Rf and time-domain techniques for evaluating novel semiconductor transistors
Auteur :
Jenkins, Keith A.
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030777777
Date de publication :
17 déc. 2022
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures.