Phase change memory: from devices to systems
Auteur :
Muralimanohar, Naveen / Qureshi, Moinuddin K. / Gurumurthi, Sudhanva / Rajendran, Bipin
Éditeur :
Springer International Publishing AG
ISBN :
9783031006074
Date de publication :
2 déc. 2011
Dimensions :
23,5 x 19,1 cm
Langue :
Anglais
Pays d'origine :
Suisse
Table of Contents: Next Generation Memory Technologies / Architecting PCM for Main Memories / Tolerating Slow Writes in PCM / Wear Leveling for Durability / Wear Leveling Under Adversarial Settings / Error Resilience in Phase Change Memories /Storage and System Design With Emerging Non-Volatile Memories