Lifetime reliability-aware design of integrated circuits
Auteur :
Raji, Mohsen / Ghavami, Behnam
Éditeur :
Springer International Publishing AG
ISBN :
9783031153471
Date de publication :
18 nov. 2023
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits.