Deep learning for advanced x-ray detection and imaging applications
Éditeur :
Springer International Publishing AG
ISBN :
9783031756528
Date de publication :
23 janv. 2025
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications.