Fundamentals of electromigration-aware integrated circuit design
Auteur :
Lienig, Jens / Rothe, Susann / Thiele, Matthias
Éditeur :
Springer International Publishing AG
ISBN :
9783031800221
Date de publication :
26 févr. 2025
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.